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SR100-Spectroscopic Reflectometer SR100
  • SR100-Spectroscopic Reflectometer SR100
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貨物所在地:國外

地: 美國

更新時間:2024-09-19 21:00:05

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First-Nano
薄膜測量系統(tǒng)
半自動引線鍵合機(jī)
Etching刻蝕系統(tǒng)
Deposition沉積系統(tǒng)
Megasonic Clean /兆聲清洗系統(tǒng)
Harrick等離子清洗機(jī)
測量儀器
PIE 等離子清洗機(jī)
Hall Effect
QCM/石英晶體微分析儀
Etching/等離子蝕刻系統(tǒng)
Thin Film薄膜沉積系統(tǒng)
美國杜邦Dupont
Ethcing/等離子蝕刻系統(tǒng)
Probe station/探針臺
Reflow Oven /回流焊
紫外掩膜對準(zhǔn)曝光系統(tǒng)
快速退火爐
生命科學(xué)
Easy to set up
Easy to operate with Window based software
Advanced optics design for best system performance
Array based detector system to ensure fast measurement
Measure film thickness and Refractiv

Spectroscopic reflectometer is our simplest tools among our product lines. By measuring reflection spectra (at normal incidence in most cases), film properties can be modeled with capable TFProbe software. If quick, routine, daily measurements on known films or simple film stack are needed in a low budget case, then SR series are a good choice. If spectra is only of  interest, like monitoring antireflection (AR)  or high reflection devices' performace, then wavelength range will be most impotant factor in selecting tools. If user needs to determine films' thickness, the optical resolution of spectrometer will also be a factor to consider. We have broad configurations available and system can  be customized to meet your specific applications.

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